PRODUCT
TAP2500、TAP3500 和 TAP4000 单端有源 FET 探头提供完美的高速电气和机械性能,满足了当今数字系统设计要求。
杰出的电气性能
高探头带宽
快速探头上升时间
完美的信号保真度
≤0.8 pF 输入电容
40 kΩ 输入电阻
-4 V ~ +4 V 输入动态范围
-10 V ~ +10 VDC输入偏置范围
±30 V (DC + 峰值 AC) 最大输入电压 (非破坏性)
通用机械性能
紧凑的小型探头头部,用来探测小型电路单元
DUT 连接附件可以连接间隙最小 0.5 mm 的 SMD
强健的设计,可靠性高
简便易用
直接连接带 TekVPI™ 探头接口的示波器
在示波器显示画面上自动确定单位和读数
简便接入示波器探头菜单画面,获得探头状态/诊断信息,控制探头 DC 偏置
通过示波器遥控 GPIB/USB 探头
应用
检验、调试和表征高速设计
信号完整性、抖动和定时分析
制造工程和测试
信号电压摆幅最高 8 Vp-p
为应用选择合适的探头是在测量中取得最佳信号保真度的关键。有源探头为高频测量提供了更真实的信号复制和保真度。由于我们的超低输入电容和独特的接口,TAP2500、TAP3500 和 TAP4000 单端有源 FET 探头提供了完美的高速电气和机械性能,满足了当今数字系统设计要求。
TAP2500、TAP3500 和 TAP4000 有源 FET 探头是为用于及直接连接带 TekVPI™ 探头接口的示波器设计的,通过解决三个传统问题,实现了高速信号采集和测量保真度:
≤0.8 pF 输入电容和 40 kΩ 输入电阻,DUT 负载影响更低
利用多功能 DUT 连接可连接到小型 SMD
在探头尖端保持仪器带宽,支持最高 3.5 GHz 示波器
TAP1500 Single-ended Active FET Probe provides excellent high-speed electrical and mechanical performance required for today's digital system designs.
Outstanding electrical performance
≥1.5 GHz probe bandwidth
<267 ps rise time
≤1 pF input capacitance
1 MΩ input resistance
-8 V to +8 V input dynamic range
-10 V to +10 VDC input offset range
Versatile mechanical performance
Small compact probe head for probing small geometry circuit elements
DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch
Robust design for reliability
Easy to use
Connects directly to oscilloscopes with the TekVPI™ probe interface
Provides automatic units scaling and readout on the oscilloscope display
Easy access to oscilloscope probe menu display for probe status/diagnostic information, and to control probe DC offset
Remote GPIB/USB probe control through the oscilloscope
Applications
High-speed Digital Systems Design
Component Design and Characterization
Manufacturing Engineering and Test
Educational Research
Signals with Voltage Swings up to 16 V
Lower DUT loading effects with ≤1 pF input capacitance and 1 MΩ input resistance
Versatile DUT connectivity for attaching to small SMDs
Preserves instrument bandwidth at the probe tip for ≤1 GHz oscilloscopes
The P7240 4 GHz, 5X active FET probe provides truer signal reproduction and fidelity for high-frequency measurements. The probe has low input capacitance and high input resistance to minimize circuit loading over a wide bandwidth range.
<120 ps Rise Time (Guaranteed)
4 GHz Bandwidth
<1 pF input capacitance
Small form factor probe head
Direct access to SMDs
Supports MSO/DPO/DSA70000 series oscilloscopes
TekConnect™ Interface
High-speed digital systems design
Component design/characterization
Signal integrity, jitter, and timing analysis
Mechanical engineering and test
Measures 3.0 V logic, InfiniBand, PCI Express, DDR, Rambus Data Lines, Gigabit Ethernet
Selecting the right probe for your application is key to attaining the best signal fidelity in your measurements. Active probes provide truer signal reproduction and fidelity for high-frequency measurements.
The small profile and low-mass head make probing dense circuitry by hand fast and easy.
Depend on Tektronix to provide you with performance you can count on. In addition to industry-leading service and support, this probe comes backed by a one-year warranty.
The accessory tips and adapters included with the P7240 probe enable it to be used on a wide variety of circuits to meet your probing needs.
The P7240 with TekConnect interface is a high-performance active probe with high bandwidth and low-capacitive loading to make it the probe of choice for demanding design applications, such as Rambus, DDR DRAM and AGP. This probe is also suited for applications in the communication industry, for measurements on Fibre Channel and Gigabit Ethernet. With the TekConnect interface, you can be assured that maximum signal integrity is maintained to meet present and future bandwidth needs.
≥1.5 GHz Bandwidth (Typical, Probe Only)
≤1 pF Input Capacitance
1 MΩ Input Resistance
Direct Access to SMDs as Small as 0.5 mm Pitch
Measures CMOS, BiCMOS, ECL, GaAs, and TTL Logic
1 GHz Bandwidth (probe only)
≤1 pF Input Capacitance
1 MΩ Input Resistance
Direct Access to SMDs as Small as 0.5 mm Pitch
Measures CMOS, BiCMOS, ECL, GaAs, and TTL Logic
Low-mass Probe Head/Cable
No Additional Power Supplies or Cables Are Required with TEKPROBE™ BNC Interface
High-speed Digital Systems Design
Component Design/Characterization
Manufacturing Engineering and Test
Educational Research
The P6245 Active FET probe achieves high-speed signal acquisition by solving three traditional problems:
Lower DUT loading (≤1 pF/1 MΩ probe loading)
Direct and easy access to SMDs
Access DUT signals and scope bandwidth for TDS600/700/3000/5000/6000/7000*1 and CSA7000 scopes up to 1 GHz bandwidths
The P6245 and P6243 Active probes provide the electrical and mechanical performance required for today's digital systems designs. No additional power supplies or cables are required when used with TEKPROBE BNC oscilloscopes. Both the P6245 and P6243 achieve high-speed signal acquisition and low circuit loading, required for solving today's problems faced by designers.
The small compact probe head and versatile attachment accessories allow direct connection to the device under test.
The P6245 and P6243 Active Probes provide scope bandwidth at the probe tip for the TDS500/600/700; the P6243 provides scope bandwidth at the probe tip for the TDS3000 Series scope up to 1 GHz bandwidth.
*1 Some TDS6000 or TDS7000 oscilloscopes require a TCA-BNC adapter.
The P6243 Active FET probe is the high-performance probing solution for 500 MHz oscilloscopes. The P6243 has a probe only bandwidth of 1 GHz and will provide a 500 MHz system bandwidth when used with Tektronix' full line of 500 MHz oscilloscopes. In addition, the P6243 is powered by the TEKPROBE BNC interface, eliminating the need for additional power supplies and cables when used with TEKPROBE BNC oscilloscopes.
The P6243 offers superior signal acquisition on surface mount devices compared to the much higher capacitive loading of passive probes. The P6243 has ≤1 pF capacitive loading which allows it to measure high-speed signals without affecting the signal or device under test. Furthermore, the included accessories and adapters allow for easy attachment to SMDs.
除另行指明外,所有技术数据都是有保障的数据。除另行指明外,所有技术数据均适用于所有型号。
衰减(仅探头)
10X
上升时间(仅探头)
<140 ps (TAP2500)
<130 ps (TAP3500)
带宽(仅探头)
≥2.5 GHz (TAP2500)
≥3.5 GHz (TAP3500)
≥4 GHz (TAP4000)
上升时间(仅探头)
≤115 ps (TAP4000)
输入电容
≤0.8 pF
输入电阻
40 kΩ
输入动态范围
±4.0 V
输入偏置范围
±10 V
最大无损输入电压
±30 V (DC + 峰值 AC)
传播延迟
5.3 ns
探头头部尺寸
高度
7.6 毫米 (0.30 英寸)
宽度
7.6 毫米 (0.30 英寸)
长度
57.2 毫米 (2.25 英寸)
其他尺寸
电缆长度
1300 毫米 (51 英寸)
重量
毛重
1.55 公斤 (3.44 磅) (探头、附件和包装)
净重
0.091 公斤 (0.2 磅) (仅探头,使用 ME 实验室规模)
探头直接由带有 TekVPI 探头接口的示波器供电。
温度
工作状态
0 °C ~ +50 ° (+32 °F ~ 122 °F)
非工作状态
-40 ° C ~ +71 °C (-40 °F ~ 160 °F)
湿度
工作状态
5% ~ 95% 相对湿度,+30 °C (+86 °F)及以下时
5% ~ 85% 相对湿度,+30 °C ~ +50 °C (+86 °F ~ +122 °F)时
无冷凝
非工作状态
5% ~ 95% 相对湿度,+30 °C (+86 °F)及以下时
5% ~ 85% 相对湿度,30 °C ~ +75 °C (+86 °F ~ +167 °F)时
无冷凝
海拔高度
工作状态
最高 4,400 米 (14,436 英尺)
非工作状态
最高 12,192 米 (40,000 英尺)
辐射规定
EN 55011,A 类
法规
一致性标签
C-Tick (澳大利亚/新西兰)
CE(欧盟)
WEEE(欧盟)
All specifications are guaranteed unless noted otherwise. All specifications apply to all models unless noted otherwise.
The probe is powered directly by oscilloscopes with the TekVPI probe interface.
Attenuation (probe only)
10X ±2%
Bandwidth (probe only)
≥1.5 GHz
Rise time (probe only)
<267 ps
Input capacitance
<1 pF
Input resistance
1 MΩ
Linearity
±8 V (16 Vp-p)
Input offset range
±10 V
Maximum non-destructive input voltage
±15 V (DC + peak AC)
Propagation delay
5.3 ns
Temperature
Operating
0 °C to +50 ° (+32 °F to 122 °F)
Nonoperating
-40 ° C to +71 °C (-40 °F to 160 °F)
Humidity
Operating
5% to 95% Relative Humidity up to +30 °C (+86 °F)
5% to 85% Relative Humidity at 30 °C to +50 °C (+86 °F to +122 °F)
noncondensing
Nonoperating
5% to 95% Relative Humidity up to +30 °C (+86 °F)
5% to 85% Relative Humidity at 30 °C to +75 °C (+86 °F to +167 °F)
noncondensing
Altitude
Operating
Up to 4,400 m (14,436 ft)
Nonoperating
Up to 12,192 m (40,000 ft)
Regulatory
Compliance labeling
WEEE (European Union)
Probe head size
Height
4.83 mm (0.19 in)
Width
7.87.1 mm (0.31 in)
Length
59.18 mm (2.30 in)
Other dimensions
Cable length
1300 mm (51 in)
Weight
Net
0.45 kg (1.0 lbs)
All specifications are guaranteed unless noted otherwise.
Rise time
≤120 ps
Attenuation
5X
Bandwidth
4.0 GHz
DC resistance
20 kΩ
Input capacitance
<1 pF
Dynamic range
±2 V
Offset range
±5 V
Unit weight (probe only)
223 g (7.52 oz)
Cable length
1.3 m (50 in)
Temperature
Operating
0 °C to +40 °C (+32 °F to +104 °F)
Nonoperating
-55 °C to +75 °C (-67 °F to +167 °F)
Humidity
0 to 90% RH at +30 °C to +40 °C (+86 °F to +104 °F)
Altitude
Operating
4572 m (15,000 ft)
Nonoperating
15,240 m (50,000 ft)
Probe Type | P6243 | P6245 |
---|---|---|
Cable Length | 1.3 m | 1.3 m |
Attenuation | 10X | 10X |
Bandwidth in GHz (Probe Only) | 1 GHz | 1.5 GHz |
Rise Time | <350 ps | <250 ps |
Input C in pF | ≤1 pF | ≤1 pF |
Input R in Ω | 1 MΩ | 1 MΩ |
Linear Dynamic Range | ±8 V | ±8 V |
DC Offset Range | N/A | 10 V |
Max Voltage (Nondestruct) (DC+PkAC) | ±15 V | ±15 V |
Propagation Delay | 5.3 ns ±200 ps | 5.3 ns ±200 ps |
型号 | 衰减 | 带宽 | 输入阻抗 | 最大电压 | 报价 |
---|---|---|---|---|---|
P6243 | 10X | 1 GHz | 1 MΩ || ≤ 1 pF | ± 8 V | US $4,200 |
TAP1500 | 10X | 1.5 GHz | 1 MΩ || ≤ 1 pF | ± 8 V | US $5,720 |
P6245 | 10X | 1.5 GHz | 1 MΩ || ≤ 1 pF | ± 8 V | US $5,940 |
TAP2500 | 10X | 2.5 GHz | 40 kΩ || ≤ 0.8 pF | ± 4 V | US $8,010 |
TAP3500 | 10X | 3.5 GHz | 40 kΩ || ≤ 0.8 pF | ± 4 V | US $10,600 |
P7240 | 5X | 4 GHz | 20 kΩ || ≤ 0.8 pF | ± 2 V | US $10,700 |
TAP4000 | 10X | 4 GHz | 40 kΩ || ≤ 0.8 pF | ± 4 V | US $11,100 |
型号 | 名称 | 大小 | 更新 | 备注 | 下载 |
---|---|---|---|---|---|
TAP2500、TAP3500 、TAP4000 | 泰克低压单端探头TAP2500、TAP3500 、TAP4000 | 336KB | 2023.08.05 | 下载 | |
TAP1500 | 泰克低压单端探头TAP1500 | 2.04M | 2023.08.05 | 下载 | |
P7240 | 泰克低压单端探头P7240 | 2.8M | 2023.08.05 | 下载 | |
P6245、P6243 | 泰克低压单端探头P6245、P6243 | 694KB | 2023.08.05 | 下载 |